Publication 2001


  • Composition Analysis of SiO2/SiC Interfaces by Electron Spectroscopic Measurements Using Slope Shaped Oxide Films
    Y. Hijikata, H. Yaguchi, M. Yoshikawa and S. Yoshida
    Applied Surface Science Vol. 184, No. 1-4, pp. 161-166 (2001).
    DOI: 10.1016/S0169-4332(01)00491-3
  • Spectroscopic Ellipsometry Study on the Electronic Structure near the Absorption Edge of GaAsN Alloys
    H. Yaguchi, S. Matsumoto, Y. Hijikata, S. Yoshida, T. Maeda, M. Ogura, D. Aoki and K. Onabe
    Physica Status Solidi B Vol. 228, No. 1, pp. 269-272 (2001).
    DOI: 10.1002/1521-3951(200111)228:1<269::AID-PSSB269>3.0.CO;2-3
  • Photoluminescence Study on Temperature Dependence of Band Gap Energy of GaAsN Alloys
    H. Yaguchi, S. Kikuchi, Y. Hijikata, S. Yoshida, D. Aoki and K. Onabe
    Physica Status Solidi B Vol. 228, No. 1, pp. 273-277 (2001).
    DOI: 10.1002/1521-3951(200111)228:1<273::AID-PSSB273>3.0.CO;2-N
  • Temperature Dependence of Excitonic Gammac-Gammav Transition Energies of GaxIn1-xP Crystals
    Y. Ishitani, H. Yaguchi and Y. Shiraki
    Japanese Journal of Applied Physics Vol. 40, No. 3A, pp. 1183-1187 (2001).
    DOI: 10.1143/JJAP.40.1183