Publication 1991
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Kinetics of Ge segregation in the presence of Sb during molecular beam
epitaxy
S. Fukatsu, K. Fujita, H. Yaguchi, Y. Shiraki, R. Ito
Materials Research Society Symposium Proceedings Vol. 220, pp. 217-222 (1991).
DOI: 10.1557/PROC-220-217
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Suppression of interfacial mixing by Sb deposition in Si/Ge strained-layer
superlattices
K. Fujita, S. Fukatsu, H. Yaguchi, T. Igarashi, Y. Shiraki, R. Ito
Materials Research Society Symposium Proceedings Vol. 220, pp. 193-197 (1991).
DOI: 10.1557/PROC-220-193
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Initial oxidation of MBE-grown Si surfaces
T. Igarashi, H. Yaguchi, K. Fujita, S. Fukatsu, Y. Shiraki, R. Ito,
T. Hattori
Materials Research Society Symposium Proceedings Vol. 220, pp. 35-39 (1991).
DOI: 10.1557/PROC-220-35
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Involvement of the topmost Ge layer in the Ge surface segregation during
Si/Ge heterostructure formation
K. Fujita, S. Fukatsu, H. Yaguchi, Y. Shiraki and R. Ito
Applied Physics Letters Vol. 59, No. 18, pp. 2240-2241 (1991).
DOI: 10.1063/1.106082
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Self-limitation in the surface segregation of Ge atoms during Si molecular
beam epitaxial growth
S. Fukatsu, K. Fujita, H. Yaguchi, Y. Shiraki and R. Ito
Applied Physics Letters Vol. 59, No. 17, pp. 2103-2105 (1991).
DOI: 10.1063/1.106412
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Strain Relaxation in MBE-Grown Si1-xGex/Si(100) Heterostructures
by Annealing
H. Yaguchi, K. Fujita, S. Fukatsu, Y. Shiraki and R. Ito
Japanese Journal of Applied Physics Vol. 30, No. 8B, pp. L1450-L1453 (1991).
DOI:
10.1143/JJAP.30.L1450