Yaguchi

Publication 2015


  • Photoluminescence study of oxidation-induced faults in 4H-SiC epilayers
    Y. Miyano, R. Asafuji, S. Yagi, Y. Hijikata, and H. Yaguchi
    AIP Advances Vol. 5, No. 12, pp. 127116-1-6 (2015).
    DOI: 10.1063/1.4938126
  • Microstructures of InN film on 4H-SiC (0001) substrate grown by RF-MBE
    P. Jantawongrit, S. Sanorpim, H. Yaguchi, M. Orihara and P. Limsuwan
    Journal of Semiconductors Vol. 36, No. 8, pp. 083002-1-5 (2015).
    DOI: 10.1088/1674-4926/36/8/083002
  • Molecular beam epitaxial growth of intermediate-band materials based on GaAs:N δ-doped superlattices
    T. Suzuki, K. Osada, S. Yagi, S. Naitoh, Y. Shoji, Y. Hijikata, Y. Okada, and H. Yaguchi
    Japanese Journal of Applied Physics Vol. 54, No. 8S1, pp. 08KA07-1-5 (2015).
    DOI: 10.7567/JJAP.54.08KA07
  • Control of intermediate-band configuration in GaAs:N δ-doped superlattice
    K. Osada, T. Suzuki, S. Yagi, S. Naitoh, Y. Shoji, Y. Hijikata, Y. Okada, and H. Yaguchi
    Japanese Journal of Applied Physics Vol. 54, No. 8S1, pp. 08KA04-1-3 (2015).
    DOI: 10.7567/JJAP.54.08KA04
  • Surface orientation dependence of SiC oxidation process studied by in-situ spectroscopic ellipsometry
    D. Goto, S. Yagi, Y. Hijikata, and H. Yaguchi
    Materials Science Forum Vols. 821-823, pp. 371-374 (2015).
    DOI: 10.4028/www.scientific.net/MSF.821-823.371
  • Photoluminescence Study of Oxidation-Induced Stacking Faults in 4H-SiC Epilayers
    Y. Miyano, S. Yagi, Y. Hijikata, and H. Yaguchi
    Materials Science Forum Vols. 821-823, pp. 327-330 (2015).
    DOI: 10.4028/www.scientific.net/MSF.821-823.327
  • Growth temperature dependence of the surface segregation of Er atoms in GaAs during molecular beam epitaxy
    R. G. Jin, S. Yagi, Y. Hijikata, and H. Yaguchi
    Japanese Journal of Applied Physics Vol. 54, No. 5, pp. 051201-1-4 (2015).
    DOI: 10.7567/JJAP.54.051201
  • Differences in SiC thermal oxidation process between crystalline surface orientations observed by in-situ spectroscopic ellipsometry
    D. Goto, Y. Hijikata, S. Yagi, and H. Yaguchi
    Journal of Applied Physics Vol. 117, No. 9, pp. 095306-1-6 (2015).
    DOI: 10.1063/1.4914050